Dynamic Light Scattering is very useful for sub-micron particle size analysis. For simple PSDs that can be approximated by a single-peak uni-modal distribution, a Gaussian analysis gives reliable results.

However a cursory reading of literature indicates that this technique is not good at characterizing polydisperse particle size distributions (PSDs).

For sub-micron particles (say, 100nm- 2 micron range), what other particle size analysis methods are the forum readers aware of... i.e. a technique that can provide PSDs for sub-micron particles with a wide distribution (maybe multi-modal since the particles are the end result of a grinding operation). I am not interested in time-consuming methods such as imaging techniques like TEM.

Note: Typically, for my application, the solid particles are suspended in water or an organic liquid like hexane.

Thanks for any inputs. ■